Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
by Adam Foster, Werner A. Hofer
2006282 pages
Springer·1 editions
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) (2006)
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) (2006)
Springer
Springer
ISBN 10: 0387372318
ISBN 13: 9780387372310