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Michael T. Postek | lit.salon
Michael T. Postek
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Books by Michael T. Postek (50 max)
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Integrated circuit metrology, inspection, and process control VII: 2-4 March 1993, San Jose California
1993
Michael T. Postek
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Scanning electron microscopy: a student's handbook
1980
Michael T. Postek, A. H. Johnson
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Integrated Circuit Metrology, Inspection, and Process Control VI: 9-11 March 1992 San Jose, California (Proceedings of S P I E)
1992
Michael T. Postek
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Critical Issues in Scanning Electron Microscope Metrology: September-October 1994
1994
Michael T. Postek
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Microlithography and metrology in micromachining: 23-24 October, 1995, Austin, Texas
1995
Michael T. Postek
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Microlithography and metrology in micromachining II: 14-15 October, 1996, Austin, Texas
1996
Michael T. Postek
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Nanostructure science, metrology, and technology: 5-7 September 2001, Gaithersburg, USA
2002
Michael T. Postek
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Instrumentation, metrology, and standards for nanomanufacturing II: 10 August 2008, San Diego, California, USA
2008
Michael T. Postek
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Instrumentation, metrology, and standards for nanomanufacturing III: 3-5 August 2009, San Diego, California, United States
2009
Michael T. Postek
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Scanning microscopy 2009: 4-7 May 2009, Monterey, California, United States
2009
Michael T. Postek
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Scanning microscopy 2009: 4-7 May 2009, Monterey, California, United States
2009
Michael T. Postek
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Instrumentation, metrology, and standards for nanomanufacturing III: 3-5 August 2009, San Diego, California, United States
2009
Michael T. Postek
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Scanning microscopy 2010 17-19 May 2010, Monterey, California, United States
2010
Michael T. Postek
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Instrumentation, metrology, and standards for nanomanufacturing IV 2-4 August 2010, San Diego, California, United States
2010
Michael T. Postek
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New research in nanotechnology
2011
Michael T. Postek, Joseph Kopanski, David Wollman
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Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V 24-25 August 2011, San Diego, California, United States
2011
Michael T. Postek, Victoria Anne Coleman
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Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States
2011
Michael T. Postek
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Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
2012
Michael T. Postek, Dale E. Newbury, S. Frank Platek, David C. Joy, Tim K. Maugel
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Scanning Microscopies 2015
2015
Michael T. Postek, Dale E. Newbury, S. Frank Platek, Tim Maugel
