Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices
by Evgeni Gusev
2006492 pages
Springer·1 editions
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Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (2006)
Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (2006)
Springer
Springer
Paperback
ISBN 10: 140204366X
ISBN 13: 9781402043666