Statistical Metrology, 1998 3rd Workshop
by International Workshop on Statistical Metrology (3rd 1998 Honolulu, Hawaii), IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers
1998121 pages
Institute of Electrical & Electronics Enginee·3 editions
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Statistical Metrology, 1998 3rd Workshop (1998)
Statistical Metrology, 1998 3rd Workshop (1998)
Institute of Electrical & Electronics Enginee
Institute of Electrical & Electronics Enginee
Paperback
ISBN 10: 0780343387
ISBN 13: 9780780343382